Quarter 4, 2002:  Volume 3, Issue 3

Reliability Edge Home

From the Editor's Desk -- Lisa Hacker

In this issue, we are pleased to include contributions from some leading experts in the field of reliability engineering. The article on reliability growth test planning and management was prepared with cooperation from Dr. Larry H. Crow and based on his teachings on the subject. In addition, you will find Dr. Wayne Nelson's article on the graphical analysis of repair data using the mean cumulative function (MCF). We also present a brief article prepared by Professor Les Warrington of the University of Warwick, which provides some background information on the benchmark survey of reliability practices that is currently underway. We appreciate their willingness to share the benefit of their experience with Reliability Edge readers and their cooperation in preparing these articles. 

This issue also contains various references to some new software products that are scheduled for upcoming release in 2003: BlockSim 6, Xfmea and RGA++. ReliaSoft’s development schedule for this year is ambitious and exciting and, upcoming issues, readers can expect more coverage of features and applications for ReliaSoft’s established products as well as new offerings.